CLEVELAND--(BUSINESS WIRE)--Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced a variety of enhancements for its award-winning Model ...

Time is money in electronics, as in other industries, and the more time that is invested in testing chips means more costs being added to the product in question. To speed up testing for memory ...

Keithley Instruments has announced the publication of Parallel Test Technology: The New Paradigm for Parametric Testing, a handbook that covers semiconductor parametric testing. The free, 60-page book ...

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...

As the transistor geometry shrinks, more transistors are packed on to a single chip, reducing manufacturing cost on a per-transistor basis. The result, however, is more transistors to test; hence, ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

Culver City, Calif.-based Parallel Systems is testing autonomous battery-electric railcars for short-haul freight operations, and has raised $49.55 million in Series A funds to help build a fleet, ...

To avoid database conflicts that may occur when different test cases in different parallel threads attempt to access the same database simultaneously, testing of the software application can be ...