Signal compression is an appealing technique to use in mixed-signal ATE (automated test equipment) systems because it can reduce the cost of test while improving tester performance. Unfortunately, ...

For the past five years, the cost of test has prevailed as the hottest topic in test. During this period, automated test equipment (ATE) has made a dramatic move towards low-cost design for test (DFT) ...

IC designers now have a powerful weapon in the struggle against rising test costs: commercially available EDA solutions that provide fast and effective means to implement scan compression on-chip. By ...