Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

In a huge software project for an embedded application, a function behaved in a strange fashion. A variable, which must not be changed while the function is executed, was changed. The function itself ...

Debugging a large system with many power rails can be challenging. However, don’t panic, a PMBus design combined with good software tools can make the job much easier. In this post we will look at a ...