As design size and complexity increase, so too does the cost of test. Both the design community and the test industry are looking at various approaches to lower the cost of manufacturing test. This ...

Design for test (DFT) has been around since the 1960s. The technology was developed to reduce the cost of creating a successful test for an IC. Scan design, fault models, and automatic test pattern ...

The dramatic rise in manufacturing test time for today’s large and complex SoCs is rooted in the use of traditional approaches to moving scan test data from chip-level pins to core-level scan channels ...

Some new design-for-test (DFT) technologies are difficult, expensive, or risky to implement but offer significant benefits. Other technologies are easy to implement but offer minor improvements. The ...

In recent years, boundary scan has transformed itself. JTAG started more than a decade ago as a simple structural interconnect test technology. It now is a foundational embedded infrastructure capable ...

To meet the increasing size of ICs, required to accommodate the integration of billions of transistors in order to deliver the performance required for tasks such as AI and autonomous vehicles, Mentor ...

Huge transistor counts, rising on-chip clock rates, the relentlessly escalating levels of integration in systems-on-chip, and the new types of defects seen in deep-submicron and nanometer processes ...