Business Wire

Keithley Adds Support for Non-Volatile Memory, Very Low Frequency C-V, and Increased Parallel Testing to Semiconductor Parameter Analyzer

CLEVELAND--(BUSINESS WIRE)--Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced a variety of enhancements for its award-winning Model ...
EDN

How to test high-speed memory with non-intrusive embedded instruments, Part 2

Having explained in part 1 the nature of the memory test challenge in the industry today, this article discusses non-intrusive debug and test methods based on embedded instruments and how these ...

New KV cache compaction technique cuts LLM memory 50x without accuracy loss

MIT researchers developed Attention Matching, a KV cache compaction technique that compresses LLM memory by 50x in seconds — ...
Semiconductor Engineering

How AI Is Changing Computing And Why Testing Is Critical

With each device generation, the semiconductor content increases, leading to an increase in test complexity. This increase in test complexity is driving the need for more and more scan pattern memory.
Semiconductor Engineering

AI Memory: Enabling The Next Era Of High-Performance Computing

The rapid advancement of artificial intelligence (AI) is driving unprecedented demand for high-performance memory solutions. AI-driven applications are fueling significant year-over-year growth in ...