FCI announced that its PwrBlade+ power connector has completed long-term reliability tests when cross-mated with TE Connectivity’s Multi-Beam XLE connector series FCI announced that its PwrBlade+ ...

Distributed systems dealing with large currents can have their “common” ground reference see substantial local variations. In automotive electronics, for instance, electric motors during cold crank ...

STAr Technologies, a leading supplier of semiconductor reliability test systems, announced the shipment of the all-in-one SMU-per-pin test system, the STAr Pluto-hiVIP, to benchmark the semiconductor ...

When accelerated testing reveals failures, what do they really mean? Understanding stress-induced artefacts in semiconductor ...

PFT Series AC hipots test medium and high voltage electrical apparatus: vacuum bottles, hot sticks, motors & generators, rubber gloves, iso-phase bus, switchgear, and other loads requiring AC ...

Testing products designed to operate from ac power is not as simple as one might think. Consider a factory with the straight-forward need to manufacture and test the heating element for a toaster.

As technology shrinks, Yield and Reliability (YAR) are major challenges of SoC (System on Chip) production. There are many techniques available for increasing YAR. YAR of devices depend on testing ...